Statistical insights from inline solar cell metrology data in a PERC production environment

Published: June 1, 2020

By Johnson Wong, Bernhard Mitchell, Sascha Esefelder, Britta Mette, Budi Tjahjono, Kwan Bum Choi, Jian Wei Ho & Gordon Deans

This paper outlines how a blend of physics-based analysis and statistical data science methods can aid continuous improvement and yield optimization in high-volume solar cell fabrication.

$40.00 excl. VAT

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