PV bypass diode faults: current testing and scope for future test development

SKU: tp-48027 Categories: , Tag:
Published: December 13, 2017

By Vivek Gade; Narendra Shiradkar

A working group of the international PV Quality Assurance Task Force has been undertaking research and testing initiatives aimed at improving the design and long-term reliability of module junction boxes and bypass diodes. Vivek Gade and Narendra Shiradkar, who are active leaders of this work, report on efforts to shine a light on a hitherto poorly understood aspect of module reliability.

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