Potential-induced degradation of bifacial PV modules incorporating PERC+ technology

Published: June 15, 2020

By Kai Sporleder, Volker Naumann, Stephan Großer, Marko Turek and Christian Hagendorf

Many of the bifacial modules now offered by PV manufacturers employ bifacial passivated emitter and rear cell (PERC+) technology, making them vulnerable to rear-side potential-induced degradation, in addition to the conventional front-side shunting type (PID-s). Kai Sporleder, Volker Naumann, Stephan Großer, Marko Turek and Christian Hagendorf of the Fraunhofer Centre for Silicon Photovoltaics report on new testing methods designed to quantify the expected power PID-related losses in bifacial PERC+ modules in the field.

$5.00 excl. VAT

This Website Uses Cookies

By continuing browsing this website you are accepting our Cookie Policy, as well as our Terms of Use and Privacy Policy.