By Kai Sporleder, Volker Naumann, Stephan Großer, Marko Turek and Christian Hagendorf
Many of the bifacial modules now offered by PV manufacturers employ bifacial passivated emitter and rear cell (PERC+) technology, making them vulnerable to rear-side potential-induced degradation, in addition to the conventional front-side shunting type (PID-s). Kai Sporleder, Volker Naumann, Stephan Großer, Marko Turek and Christian Hagendorf of the Fraunhofer Centre for Silicon Photovoltaics report on new testing methods designed to quantify the expected power PID-related losses in bifacial PERC+ modules in the field.
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