By Benoit Braisaz1, Benjamin Commault2,3, Nam Le Quang4, Samuel Williatte4, Marc Pirot2,3, Eric Gerritsen2,3, Maryline Joanny2,3, Didier Binesti1, Thierry Galvez4, Gilles Goaer4 & Khalid Radouane, 1EDF R&D, ENERBAT, F-77250 Moret sur Loing; 2Univ. Grenoble Alpes, INES, Le Bourget du Lac; 3CEA, LITEN, Le Bourget du Lac; 4EDF ENR PWT, Bourgoin-Jallieu; 5EDF EN, La Défense, France
Even though it is now more than five years since potential-induced degradation (PID) began to proliferate, and despite the fact that solutions are under development, it is currently still the most discussed mode of degradation associated with cracking in PV modules.
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