Opps!! You didn't choose any image for magnifying action

PID –1,500V readiness of PV modules: Some solutions and how to assess them in the lab

Published: January 3, 2017

By Benoit Braisaz1, Benjamin Commault2,3, Nam Le Quang4, Samuel Williatte4, Marc Pirot2,3, Eric Gerritsen2,3, Maryline Joanny2,3, Didier Binesti1, Thierry Galvez4, Gilles Goaer4 & Khalid Radouane, 1EDF R&D, ENERBAT, F-77250 Moret sur Loing; 2Univ. Grenoble Alpes, INES, Le Bourget du Lac; 3CEA, LITEN, Le Bourget du Lac; 4EDF ENR PWT, Bourgoin-Jallieu; 5EDF EN, La Défense, France

Even though it is now more than five years since potential-induced degradation (PID) began to proliferate, and despite the fact that solutions are under development, it is currently still the most discussed mode of degradation associated with cracking in PV modules.

Single Paper

Includes one paper digital access
US$ 21

Photovoltaics International SubscriptionDigital & Archive

Includes 12 months of unlimited digital access to the Photovoltaics International content, full online archive, technical paper collection (over 700), and more.

Includes 2 upcoming issues in digital.

US$ 449 per year

This Website Uses Cookies

By continuing browsing this website you are accepting our Cookie Policy, as well as our Terms of Use and Privacy Policy.