By Dr Volker Naumann; Dr Nadine Schüler; Dr Christian Hagendorf
Potential-induced degradation (PID) is still one of the main reasons for unpredictable power losses in PV power plants. Volker Naumann, Nadine Schüler and Christian Hagendorf of Fraunhofer CSP and Freiberg Instruments present an approach for quick on-site PID testing of mounted PV modules, allowing PID diagnosis and prognosis of PID-related yield losses
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