Metrology at the ingot level: Addressing the growing importance of bulk material quality

Published: October 21, 2016

By Bernhard Mitchell, Daniel Chung, Jürgen Weber & Thorsten Trupke University of New South Wales (UNSW), Sydney; BT Imaging Pty Ltd, Sydney, Australia

With the PV industry continually pushing for ever-higher silicon solar cell efficiencies, the requirements on the electronic quality of the bulk material are becoming more stringent. Advanced characterization of silicon
ingots after cutting into bricks allows early quality control and immediate feedback in crystal growth, thereby facilitating shorter R&D cycles, higher yield, lower cost and higher product quality in mass manufacturing.

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